-
-
Service Offerings
-
-
-
-
Validation Analysis
Ultrasonic Testing (SAT)
- Detailed description
- SAT Principle
- Usage patterns
- Case images
-
- Commodity name: Ultrasonic Testing (SAT)
Long-term Analysis of Equipment Usage: SONOSCAN Gen7 C-Scan Ultrasonic Scanning Microscope
-
SAT ultrasound, also known as SAM, primarily utilizes the reflection and transmission properties of ultrasonic waves. It generates ultrasonic pulses and captures their returning echoes to create images. When ultrasonic waves encounter interfaces between different materials, they reflect, producing distinct echo signals that allow researchers to identify defects within the material's internal structure.
It can detect extremely small delamination layers and precisely locate interfaces, wafer cracks, delaminations, cracks, voids, and tilt offsets.
-
(C-Scan Mode) Specified Depth Profile
Features: Acoustic data is collected along the depth (Z) axis in the X-Y plane using a reflective acoustic microscope, and the C-Scan offers high resolution, enabling individual scanning of each material layer.
(T-Scan Mode) Penetration Scan Mode
Features: Acoustic data is collected across the entire depth (Z) in the X-Y plane using a transmission acoustic microscope. In contrast, T-Scan can only utilize low-frequency probes—with limited resolution and poor layer-detection capability. When identifying large defects within devices, T-mode is significantly faster than C-mode.
(A-Scan Mode) Single-point Depth Signal
Features: Acquire acoustic data within the smallest X-Y-Z area achievable by the given acoustic microscope, intended for focusing the acoustic microscope.
(B-Scan Mode) Cross-sectional View
Features: Utilizing a reflective acoustic microscope to acquire acoustic data along the X-Z or Y-Z plane's depth direction, providing cross-sectional acoustic information for tracking defect depth.
-
Category:
Get a quote
Please note: If you're interested in our services, please leave your email to receive a free project quote. Thank you!
