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Validation Analysis
Lifetime Operational Test (OLT)
- Detailed description
- Case Study Sharing
- Scope of application
- Equipment Specifications
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- Commodity name: Lifetime Operational Test (OLT)
HTOL (High/Low Temperature Operating Life Test), or the High/Low Temperature Life Test, is a method that uses temperature and voltage acceleration to estimate a chip's long-term operational lifespan within a short testing period—essentially providing a "life cycle prediction." Typically, the bathtub curve is divided into three distinct phases: the infant mortality phase, the useful life phase, and the wear-out phase. For each of these stages, there are specific test methodologies tailored to accurately assess the failure rates associated with that particular section.
What can Jiuxi do for you?
BI (Burn-in) / ELFR (Early Life Failure Rate): Evaluates the failure rate during the early-life stage or reduces the early-life defect rate through the BI method—measured as DPPM (Defects Per Million Parts).
HTOL (High Temperature Operating Life): The lifespan—measured in FIT / MTTF—that assesses the usable operating period.There are also corresponding test methods and conditions for different product attributes, such as the BLT (Bias Life Test) procedure.
All of the experimental conditions mentioned above require the application of a power supply or signal source to bring the components into either operational or steady-state conditions. Under the combined influence of acceleration factors such as voltage, temperature, and time, these conditions induce material aging, enabling researchers to calculate the product's estimated failure rate, Mean Time To Failure (MTTF), and Failure In Time (FIT) based on the test results.
Failure Mode
The failure rate statistics and failure causes, categorized into the three segments of the Bathtub Curve, are summarized as follows:
Infant Mortality Period: The failure rate drops sharply and rapidly—causes of failure include design flaws or process defects.
Useful Life: Low and stable failure rate—failures occur randomly (e.g., EOS failures)
Wear-Out Phase: The failure rate rapidly increases—caused by aging.
Service Advantages
★ Full-range Burn-in System, featuring individual power consumption control and independent temperature regulation.
★ Full range of standard boards/custom boards, plus circuit design, PCB layout, PCB assembly, and customized sockets.
Reference Standards
JESD 47
JESD 74
JESD22-A101
JESD22-A110
JESD22-A108
Applicable Fields
Automotive, consumer, commercial, industrial
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