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Service Offerings
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Validation Analysis
Electrical Testing
- Detailed description
- Case Study Sharing
- Scope of application
- Equipment Specifications
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- Commodity name: Electrical Testing
The electrical characterization module is designed for analyzing the current–voltage characteristics of semiconductor devices and micro/nanostructures, meeting high‑precision measurement requirements across a range from µA to nA. It supports both automated parallel testing and manual precision measurements.
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Semiconductor device IV Characteristic Curve Scanning (diode, MOSFETs, BJTs, etc.
of large-scale array devices Batch Electrical Screening and Yield Statistics ( Smart 1）
High-Voltage Devices, Insulation Structures, and Leakage Current Testing ( Keysight B2901A)
Micro- and nano-electrodes, MEMS and Advanced Packaging: Small-Size Probe Contact Testing (TX 2)
Reliability Assessment: Breakdown Voltage, Leakage Current, On-Resistance, Hysteresis Characteristics Parameter extraction, etc.
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Smart-1
Device specifications: accuracy at the µA level, voltage range ±9 V, 64-channel automatic measurement with ACT, and external probe-based measurements.
Keysight B2901A
Device specifications: Accuracy at the nA level, voltage range ±200 V, supports manual measurement and external probe measurement.
TX-2
Equipment capabilities: four‑needle configuration with 0.5 µm soft needles and 1 µm hard needles; can be integrated with power supplies, oscilloscopes, IV‑curve testers, and other test equipment.
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